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翻訳と辞書　辞書検索 [ 開発暫定版 ] スポンサード リンク X-ray standing waves ： ウィキペディア英語版 X-ray standing waves The X-ray standing wave (XSW) technique can be used to study the structure of surfaces and interfaces with high spatial resolution and chemical selectivity. Pioneered by B.W. Batterman in the 1960s 〔B. W. Batterman and H. Cole, ''Dynamical Diffraction of X Rays by Perfect Crystals'', (Rev. Mod. Phys. 36 (1964) 681 )〕 the availability of synchrotron light has stimulated the application of this interferometric technique to a wide range of problems in surface science.〔J. Zegenhagen, ''Surface structure determination with X-ray standing waves'' ( Surf. Sci. Rep. 18(7/8) (1993) 199 )〕〔D. P. Woodruff, ''Surface structure determination using x-ray standing waves'', ( Rep. Prog. Phys. 68(4) (2005) 743 )〕 == Basic principles == An X-ray interference field created by Bragg reflection provides the length scale against which atomic distances can be measured. The spatial modulation of this field described by the dynamical theory of X-ray diffraction undergoes a pronounced change when the sample is scanned through the Bragg condition. Due to a relative phase variation between the incoming and the reflected beam the nodal planes of the XSW field shift by half a lattice constant.〔J. Als-Nielsen and D. McMorrow, ''Elements of Modern X-ray Physics'', John Wiley & Sons, Ltd. (2000)〕 Depending on the position of the atoms within this wave field the element specific absorption of X-rays varies in a characteristic way. Therefore, measurement of the photo yield – via X-ray fluorescence or photoelectron spectroscopy – can reveal the position of the atoms relative to the lattice planes. For a quantitative analysis the normalized photo yield $Y\_p$ is described by 〔〔 $Y\_(\backslash Omega)\; =\; 1\; +\; R\; +\; 2C\; \backslash sqrt\; f\_H\; \backslash cos\; (\backslash nu\; -\; 2\backslash pi\; P\_H\; )$, where $R$ is the reflectivity and $\backslash nu$ is the relative phase of the interfering beams. The characteristic shape of $Y\_p$ can be used to derive precise structural information about the surface atoms because the two parameters $f\_H$ (coherent fraction) and $P\_H$ (coherent position) are directly related to the Fourier representation of the atomic distribution function. 抄文引用元・出典: フリー百科事典『 ウィキペディア（Wikipedia）』 ■ウィキペディアで「X-ray standing waves」の詳細全文を読む スポンサード リンク 翻訳と辞書 : 翻訳のためのインターネットリソース Copyright(C) kotoba.ne.jp 1997-2016. All Rights Reserved.